The characteristics of different elements are different from X ray energy and wavelength. Therefore, by measuring the energy or wavelength of X ray, we can know which element is emitted and make qualitative analysis of elements. At the same time, the intensity of the characteristic X ray emitted from a sample after being stimulated is related to the content of this element in the sample. Therefore, the strength of the sample can be quantitatively analyzed by elemental analysis.
Therefore, there are two basic types of X - ray fluorescence spectrometer:
Wavelength dispersive (WD-XRF) and energy dispersive (ED-XRF)