The X-ray fluorescence analysis can be divided into two types: energy dispersion and wavelength dispersion, and
X-ray fluorescence analysis
is usually called the spectrometer and the Spectrometer, abbreviated to EDXRF and WDXRF.
By measuring the energy of the fluorescence X-ray, the analysis of the measured sample is called Energy dispersive X-ray fluorescence analysis, the corresponding instrument called the Energy spectrometer, through the determination of fluorescence X-ray wavelength to achieve the analysis of the measured sample is called wavelength dispersive X-ray fluorescence analysis, the corresponding instrument called X-ray fluorescence spectrometer.
According to different excitation methods, X-ray fluorescence Analyzer can be divided into two kinds: source excitation and tube excitation. x-rays emitted by radioisotope sources as X-rays of primary X-ray are called source-excitation instruments, and X-ray fluorescence analyzers that produce primary X-rays using X-rays generators (also known as X-rays) are called tube-excitation instruments.
In the case of energy dispersive instruments, according to the different detectors, X-ray fluorescence Analyzer can be divided into two main types: semiconductor detectors and proportional counting tubes.
According to the size of analytical capacity can also be divided into multiple element analysis instruments and individual element analysis instruments. Such a call
X-ray fluorescence analysis is used for energy dispersive instruments.
In wavelength dispersive instruments, according to the number of elements can be analyzed can be divided into the single path scanning X-ray fluorescence spectrometer, small multi-channel X-ray fluorescence spectrometer and large-scale X-ray fluorescence spectrometer.